BibTeX record conf/itc/ChaudhuriYCC19

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@inproceedings{DBLP:conf/itc/ChaudhuriYCC19,
  author       = {Arjun Chaudhuri and
                  Bonan Yan and
                  Yiran Chen and
                  Krishnendu Chakrabarty},
  title        = {Hardware Fault Tolerance for Binary {RRAM} Crossbars},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
                  USA, November 9-15, 2019},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2019},
  url          = {https://doi.org/10.1109/ITC44170.2019.9000179},
  doi          = {10.1109/ITC44170.2019.9000179},
  timestamp    = {Mon, 04 Jul 2022 14:19:36 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/ChaudhuriYCC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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