BibTeX record conf/itc/ChaudhuriCTMDC21

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@inproceedings{DBLP:conf/itc/ChaudhuriCTMDC21,
  author       = {Arjun Chaudhuri and
                  Ching{-}Yuan Chen and
                  Jonti Talukdar and
                  Siddarth Madala and
                  Abhishek Kumar Dubey and
                  Krishnendu Chakrabarty},
  title        = {Efficient Fault-Criticality Analysis for {AI} Accelerators using a
                  Neural Twin\({}^{\mbox{{\({_\ast}\)}}}\)},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
                  October 10-15, 2021},
  pages        = {73--82},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ITC50571.2021.00015},
  doi          = {10.1109/ITC50571.2021.00015},
  timestamp    = {Mon, 26 Jun 2023 20:48:14 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/ChaudhuriCTMDC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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