BibTeX record conf/itc/ChangTLPM98

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@inproceedings{DBLP:conf/itc/ChangTLPM98,
  author       = {Jonathan T.{-}Y. Chang and
                  Chao{-}Wen Tseng and
                  Chien{-}Mo James Li and
                  Mike Purtell and
                  Edward J. McCluskey},
  title        = {Analysis of pattern-dependent and timing-dependent failures in an
                  experimental test chip},
  booktitle    = {Proceedings {IEEE} International Test Conference 1998, Washington,
                  DC, USA, October 18-22, 1998},
  pages        = {184--193},
  publisher    = {{IEEE} Computer Society},
  year         = {1998},
  url          = {https://doi.org/10.1109/TEST.1998.743151},
  doi          = {10.1109/TEST.1998.743151},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ChangTLPM98.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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