Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System.

Michael Catalano Richard K. Feldman Roberto Krutiansky Richard Swan Individual Signal Path Calibration for Maximum Timing Accuracy in a High Pincount VLSI Test System. 188-192 1983 conf/itc/1983 ITC db/conf/itc/itc1983.html#CatalanoFKS83