BibTeX record conf/itc/BriersT86

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@inproceedings{DBLP:conf/itc/BriersT86,
  author       = {A. J. Briers and
                  K. A. E. Totton},
  title        = {Random Pattern Testability by Fast Fault Simulation},
  booktitle    = {Proceedings International Test Conference 1986, Washington, D.C.,
                  USA, September 1986},
  pages        = {274--281},
  publisher    = {{IEEE} Computer Society},
  year         = {1986},
  timestamp    = {Tue, 22 Oct 2002 12:22:37 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/BriersT86.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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