Minimizing Test Time by Exploiting Parallelism in Macro Test.

Hans Bouwmeester Steven Oostdijk Frank Bouwman Rudi Stans Loek Thijssen Frans P. M. Beenker Minimizing Test Time by Exploiting Parallelism in Macro Test. 451-460 1993 conf/itc/1993 ITC db/conf/itc/itc1993.html#BouwmeesterOBSTB93