DBLP Record 'conf/itc/BouwmeesterOBSTB93'

BibTeX

@inproceedings{DBLP:conf/itc/BouwmeesterOBSTB93,
  author    = {Hans Bouwmeester and
               Steven Oostdijk and
               Frank Bouwman and
               Rudi Stans and
               Loek Thijssen and
               Frans P. M. Beenker},
  title     = {Minimizing Test Time by Exploiting Parallelism in Macro
               Test},
  booktitle = {ITC},
  year      = {1993},
  pages     = {451-460},
  crossref  = {DBLP:conf/itc/1993},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1993,
  title     = {Proceedings IEEE International Test Conference 1993, Designing,
               Testing, and Diagnostics - Join Them, Baltimore, Maryland,
               USA, October 17-21, 1993},
  publisher = {IEEE Computer Society},
  year      = {1993},
  isbn      = {0-7803-1430-1},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}