BibTeX record conf/itc/BouwmeesterOBSTB93

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@inproceedings{DBLP:conf/itc/BouwmeesterOBSTB93,
  author       = {Hans Bouwmeester and
                  Steven Oostdijk and
                  Frank Bouwman and
                  Rudi Stans and
                  Loek Thijssen and
                  Frans P. M. Beenker},
  title        = {Minimizing Test Time by Exploiting Parallelism in Macro Test},
  booktitle    = {Proceedings {IEEE} International Test Conference 1993, Designing,
                  Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
                  17-21, 1993},
  pages        = {451--460},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/TEST.1993.470666},
  doi          = {10.1109/TEST.1993.470666},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BouwmeesterOBSTB93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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