BibTeX record conf/itc/Bottorff82

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@inproceedings{DBLP:conf/itc/Bottorff82,
  author       = {Peter S. Bottorff},
  title        = {Fault Modeling and Test Effectiveness Evaluation for {VLSI} Circuits},
  booktitle    = {Proceedings International Test Conference 1982, Philadelphia, PA,
                  USA, November 1982},
  pages        = {24},
  publisher    = {{IEEE} Computer Society},
  year         = {1982},
  timestamp    = {Thu, 23 Feb 2012 17:18:14 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Bottorff82.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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