BibTeX
@inproceedings{DBLP:conf/itc/BoseAA93,
author = {Soumitra Bose and
Prathima Agrawal and
Vishwani D. Agrawal},
title = {Generation of Compact Delay Tests by Multiple-Path Activation},
booktitle = {ITC},
year = {1993},
pages = {714-723},
crossref = {DBLP:conf/itc/1993},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1993,
title = {Proceedings IEEE International Test Conference 1993, Designing,
Testing, and Diagnostics - Join Them, Baltimore, Maryland,
USA, October 17-21, 1993},
publisher = {IEEE Computer Society},
year = {1993},
isbn = {0-7803-1430-1},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2002-04-16 by Michael Ley (ley@uni-trier.de)