<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/itc/BiewengaHJL99" mdate="2003-03-26">
<author>Alex Biewenga</author>
<author>Henk D. L. Hollmann</author>
<author>Frans de Jong</author>
<author>Maurice Lousberg</author>
<title>Static component interconnect test technology (SCITT) a new technology for assembly testing.</title>
<pages>439-448</pages>
<year>1999</year>
<crossref>conf/itc/1999</crossref>
<booktitle>ITC</booktitle>
<url>db/conf/itc/itc1999.html#BiewengaHJL99</url>
</inproceedings>
</dblp>
