Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits.

Yves Bertrand Frédéric Bancel Michel Renovell Multiconfiguration Technique to Reduce Test Duration for Sequential Circuits. 989-997 1993 conf/itc/1993 ITC db/conf/itc/itc1993.html#BertrandBR93 http://dx.doi.org/10.1109/TEST.1993.470600