Brady Benware Chris Schuermyer Sreenevasan Ranganathan Robert Madge Prabhu Krishnamurthy Nagesh Tamarapalli Kun-Han Tsai Janusz Rajski Impact of Multiple-Detect Test Patterns on Product Quality. 1031-1040 2003 conf/itc/2003 ITC http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631031abs.htm db/conf/itc/itc2003.html#BenwareSRMKTTR03