DBLP Record 'conf/itc/BenwareSRMKTTR03'

BibTeX

@inproceedings{DBLP:conf/itc/BenwareSRMKTTR03,
  author    = {Brady Benware and
               Chris Schuermyer and
               Sreenevasan Ranganathan and
               Robert Madge and
               Prabhu Krishnamurthy and
               Nagesh Tamarapalli and
               Kun-Han Tsai and
               Janusz Rajski},
  title     = {Impact of Multiple-Detect Test Patterns on Product Quality},
  booktitle = {ITC},
  year      = {2003},
  pages     = {1031-1040},
  ee        = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20631031abs.htm},
  crossref  = {DBLP:conf/itc/2003},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2003,
  title     = {Proceedings 2003 International Test Conference (ITC 2003),
               Breaking Test Interface Bottlenecks, 28 September - 3 October
               2003, Charlotte, NC, USA},
  publisher = {IEEE Computer Society},
  year      = {2003},
  isbn      = {0-7803-8106-8},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}