Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model.

Brady Benware Cam Lu John Van Slyke Prabhu Krishnamurthy Robert Madge Martin Keim Mark Kassab Janusz Rajski Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. 1285-1294 2004 conf/itc/2004 ITC http://doi.ieeecomputersociety.org/10.1109/ITC.2004.26 db/conf/itc/itc2004.html#BenwareLSKMKKR04