DBLP Record 'conf/itc/BenwareLSKMKKR04'

BibTeX

@inproceedings{DBLP:conf/itc/BenwareLSKMKKR04,
  author    = {Brady Benware and
               Cam Lu and
               John Van Slyke and
               Prabhu Krishnamurthy and
               Robert Madge and
               Martin Keim and
               Mark Kassab and
               Janusz Rajski},
  title     = {Affordable and Effective Screening of Delay Defects in ASICs
               using the Inline Resistance Fault Model},
  booktitle = {ITC},
  year      = {2004},
  pages     = {1285-1294},
  ee        = {http://doi.ieeecomputersociety.org/10.1109/ITC.2004.26},
  crossref  = {DBLP:conf/itc/2004},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2004,
  title     = {Proceedings 2004 International Test Conference (ITC 2004),
               October 26-28, 2004, Charlotte, NC, USA},
  publisher = {IEEE},
  year      = {2003},
  isbn      = {0-7803-8581-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}