Frank te Beest Ad M. G. Peeters Marc Verra Kees van Berkel Hans G. Kerkhoff Automatic Scan Insertion and Test Generation for Asynchronous Circuits. 804-813 2002 conf/itc/2002 ITC http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430804abs.htm db/conf/itc/itc2002.html#BeestPVBK02