BeestPVBK02'

BibTeX

@inproceedings{DBLP:conf/itc/BeestPVBK02,
  author    = {Frank te Beest and
               Ad M. G. Peeters and
               Marc Verra and
               Kees van Berkel and
               Hans G. Kerkhoff},
  title     = {Automatic Scan Insertion and Test Generation for Asynchronous
               Circuits},
  booktitle = {ITC},
  year      = {2002},
  pages     = {804-813},
  ee        = {http://csdl.computer.org/comp/proceedings/itc/2002/7543/00/75430804abs.htm},
  crossref  = {DBLP:conf/itc/2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/2002,
  title     = {Proceedings IEEE International Test Conference 2002, Baltimore,
               MD, USA, October 7-10, 2002},
  publisher = {IEEE Computer Society},
  year      = {2002},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}