@inproceedings{DBLP:conf/itc/BarnettS03,
author = {Thomas S. Barnett and
Adit D. Singh},
title = {Relating Yield Models to Burn-In Fall-Out in Time},
booktitle = {ITC},
year = {2003},
pages = {77-84},
ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2003.1270827},
crossref = {DBLP:conf/itc/2003},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/2003,
title = {Proceedings 2003 International Test Conference (ITC 2003),
Breaking Test Interface Bottlenecks, 28 September - 3 October
2003, Charlotte, NC, USA},
publisher = {IEEE Computer Society},
year = {2003},
isbn = {0-7803-8106-8},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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