BibTeX record conf/itc/Bandes84

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@inproceedings{DBLP:conf/itc/Bandes84,
  author       = {Dean Bandes},
  title        = {Exploratory Data Analysis Makes Testing More Valuable for Semiconductor
                  Manufacturing},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {350--358},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 13:40:15 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Bandes84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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