BibTeX record conf/itc/AvraM93

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@inproceedings{DBLP:conf/itc/AvraM93,
  author       = {LaNae J. Avra and
                  Edward J. McCluskey},
  title        = {Synthesizing for Scan Dependence in Built-In Self-Testable Desings},
  booktitle    = {Proceedings {IEEE} International Test Conference 1993, Designing,
                  Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October
                  17-21, 1993},
  pages        = {734--743},
  publisher    = {{IEEE} Computer Society},
  year         = {1993},
  url          = {https://doi.org/10.1109/TEST.1993.470629},
  doi          = {10.1109/TEST.1993.470629},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AvraM93.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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