BibTeX
@inproceedings{DBLP:conf/itc/ArabiIDK98,
author = {Karim Arabi and
Hassan Ihs and
Christian Dufaza and
Bozena Kaminska},
title = {Digital oscillation-test method for delay and stuck-at fault
testing of digital circuits},
booktitle = {ITC},
year = {1998},
pages = {91-100},
ee = {http://www.computer.org/proceedings/itc/5093/50930091abs.htm},
crossref = {DBLP:conf/itc/1998},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1998,
title = {Proceedings IEEE International Test Conference 1998, Washington,
DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
year = {1998},
isbn = {0-7803-5093-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2002-10-22 by Michael Ley (ley@uni-trier.de)