BibTeX record conf/itc/AmyeenVM09

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@inproceedings{DBLP:conf/itc/AmyeenVM09,
  author       = {M. Enamul Amyeen and
                  Srikanth Venkataraman and
                  Mun Wai Mak},
  editor       = {Gordon W. Roberts and
                  Bill Eklow},
  title        = {Microprocessor system failures debug and fault isolation methodology},
  booktitle    = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
                  USA, November 1-6, 2009},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/TEST.2009.5355702},
  doi          = {10.1109/TEST.2009.5355702},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AmyeenVM09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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