BibTeX record conf/itc/AmyeenKCNVJGS16

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@inproceedings{DBLP:conf/itc/AmyeenKCNVJGS16,
  author       = {M. Enamul Amyeen and
                  Dongok Kim and
                  Maheshwar Chandrasekar and
                  Mohammad Noman and
                  Srikanth Venkataraman and
                  Anurag Jain and
                  Neha Goel and
                  Ramesh Sharma},
  title        = {A novel diagnostic test generation methodology and its application
                  in production failure isolation},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805821},
  doi          = {10.1109/TEST.2016.7805821},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/AmyeenKCNVJGS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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