BibTeX record conf/itc/Aldrete-VidrioOAMS09

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@inproceedings{DBLP:conf/itc/Aldrete-VidrioOAMS09,
  author       = {Eduardo Aldrete{-}Vidrio and
                  Marvin Onabajo and
                  Josep Altet and
                  Diego Mateo and
                  Jos{\'{e}} Silva{-}Mart{\'{\i}}nez},
  editor       = {Gordon W. Roberts and
                  Bill Eklow},
  title        = {Non-invasive {RF} built-in testing using on-chip temperature sensors},
  booktitle    = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
                  USA, November 1-6, 2009},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/TEST.2009.5355901},
  doi          = {10.1109/TEST.2009.5355901},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Aldrete-VidrioOAMS09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}