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DBLP Record 'conf/itc/Albrow83'

BibTeX

@inproceedings{DBLP:conf/itc/Albrow83,
  author    = {Robert Albrow},
  title     = {Test Pattern Compaction in VLSI Testers},
  booktitle = {ITC},
  year      = {1983},
  pages     = {12-17},
  crossref  = {DBLP:conf/itc/1983},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1983,
  title     = {Proceedings International Test Conference 1983, Philadelphia,
               PA, USA, October 1983},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1983},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2002-11-05 by Michael Ley (ley@uni-trier.de)