BibTeX
@inproceedings{DBLP:conf/itc/Albrow83,
author = {Robert Albrow},
title = {Test Pattern Compaction in VLSI Testers},
booktitle = {ITC},
year = {1983},
pages = {12-17},
crossref = {DBLP:conf/itc/1983},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/itc/1983,
title = {Proceedings International Test Conference 1983, Philadelphia,
PA, USA, October 1983},
booktitle = {ITC},
publisher = {IEEE Computer Society},
year = {1983},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2002-11-05 by Michael Ley (ley@uni-trier.de)