DBLP Record 'conf/itc/AizenbudCLSKIR92'

BibTeX

@inproceedings{DBLP:conf/itc/AizenbudCLSKIR92,
  author    = {Yaron Aizenbud and
               Paul Chang and
               Moshe Leibowitz and
               Dave Smith and
               Bernd K{\"o}nemann and
               Vijay S. Iyengar and
               Barry K. Rosen},
  title     = {AC Test Quality: Beyond Transition Fault Coverage},
  booktitle = {ITC},
  year      = {1992},
  pages     = {568-577},
  crossref  = {DBLP:conf/itc/1992},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/itc/1992,
  title     = {Proceedings IEEE International Test Conference 1992, Discover
               the New World of Test and Design, Baltimore, Maryland, USA,
               September 20-24, 1992},
  booktitle = {ITC},
  publisher = {IEEE Computer Society},
  year      = {1992},
  isbn      = {0-7803-0760-7},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}