BibTeX record conf/itc/AgrawalA84

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@inproceedings{DBLP:conf/itc/AgrawalA84,
  author       = {Dharma P. Agrawal and
                  Sami A. Al{-}Arian},
  title        = {Comprehensive Fault Model and Testing of {CMOS} Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {218--223},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 13:40:15 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AgrawalA84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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