Ron Press Erik H. Volkerink 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010 IEEE 2010 978-1-4244-7206-2 http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5684496 ITC db/conf/itc/itc2010.html