<?xml version="1.0"?>
<dblp>
<proceedings key="conf/itc/1994" mdate="2003-03-26">
<title>Proceedings IEEE International Test Conference 1994, TEST: The Next 25 Years, Washington, DC, USA, October 2-6, 1994</title>
<publisher>IEEE Computer Society</publisher>
<year>1994</year>
<isbn>0-7803-2103-0</isbn>
<url>db/conf/itc/itc1994.html</url>
</proceedings>

</dblp>
