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DBLP Record 'conf/itc/1994'

BibTeX

@proceedings{DBLP:conf/itc/1994,
  title     = {Proceedings IEEE International Test Conference 1994, TEST:
               The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
  publisher = {IEEE Computer Society},
  year      = {1994},
  isbn      = {0-7803-2103-0},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

Copyright © 2003-03-26 by Michael Ley (ley@uni-trier.de)