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@proceedings{DBLP:conf/itc/1994,
title = {Proceedings IEEE International Test Conference 1994, TEST:
The Next 25 Years, Washington, DC, USA, October 2-6, 1994},
publisher = {IEEE Computer Society},
year = {1994},
isbn = {0-7803-2103-0},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2003-03-26 by Michael Ley (ley@uni-trier.de)