BibTeX record conf/itc/0001D22

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@inproceedings{DBLP:conf/itc/0001D22,
  author       = {Sebastian Huhn and
                  Rolf Drechsler},
  title        = {Next Generation Design For Testability, Debug and Reliability Using
                  Formal Techniques},
  booktitle    = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
                  September 23-30, 2022},
  pages        = {609--618},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITC50671.2022.00086},
  doi          = {10.1109/ITC50671.2022.00086},
  timestamp    = {Sat, 30 Sep 2023 09:50:58 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/0001D22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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