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BibTeX record conf/itc-asia/YanZWCHGW23
@inproceedings{DBLP:conf/itc-asia/YanZWCHGW23, author = {Aibin Yan and Chao Zhou and Shaojie Wei and Jie Cui and Zhengfeng Huang and Patrick Girard and Xiaoqing Wen}, title = {Design of a Novel Latch with Quadruple-Node-Upset Recovery for Harsh Radiation Hardness}, booktitle = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue, Japan, September 12-14, 2023}, pages = {1--6}, publisher = {{IEEE}}, year = {2023}, url = {https://doi.org/10.1109/ITC-Asia58802.2023.10301187}, doi = {10.1109/ITC-ASIA58802.2023.10301187}, timestamp = {Wed, 15 Nov 2023 09:43:46 +0100}, biburl = {https://dblp.org/rec/conf/itc-asia/YanZWCHGW23.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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