BibTeX record conf/itc-asia/WuCLCH23

• > Home > conf/itc-asia/WuCLCH23

@inproceedings{DBLP:conf/itc-asia/WuCLCH23,
  author       = {Meng{-}Shan Wu and
                  Yen{-}Lin Chua and
                  Jin{-}Fu Li and
                  Yun{-}Ting Chuan and
                  Shih{-}Hsu Huang},
  title        = {Fault-Aware {ECC} Scheme for Enhancing the Read Reliability of STT-MRAMs},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
                  Japan, September 12-14, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ITC-Asia58802.2023.10301173},
  doi          = {10.1109/ITC-ASIA58802.2023.10301173},
  timestamp    = {Thu, 16 Nov 2023 08:55:20 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/WuCLCH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}