BibTeX record conf/itc-asia/TsaiLW22

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@inproceedings{DBLP:conf/itc-asia/TsaiLW22,
  author       = {Jiun{-}Cheng Tsai and
                  Aaron C.{-}W. Liang and
                  Charles H.{-}P. Wen},
  title        = {Timing-Critical Path Analysis in Circuit Designs Considering Aging
                  with Signal Probability},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {37--42},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00017},
  doi          = {10.1109/ITCASIA55616.2022.00017},
  timestamp    = {Tue, 07 May 2024 20:12:32 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/TsaiLW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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