BibTeX record conf/itc-asia/TokaiAYH23

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@inproceedings{DBLP:conf/itc-asia/TokaiAYH23,
  author       = {Shogo Tokai and
                  Daichi Akamatsu and
                  Hiroyuki Yotsuyanagi and
                  Masaki Hashizume},
  title        = {On Test Pattern Generation Method for an Approximate Multiplier Considering
                  Acceptable Faults},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2023, Matsue,
                  Japan, September 12-14, 2023},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ITC-Asia58802.2023.10301158},
  doi          = {10.1109/ITC-ASIA58802.2023.10301158},
  timestamp    = {Wed, 15 Nov 2023 09:43:46 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/TokaiAYH23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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