BibTeX record conf/itc-asia/NishimiSKN18

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@inproceedings{DBLP:conf/itc-asia/NishimiSKN18,
  author       = {Takeru Nishimi and
                  Yasuo Sato and
                  Seiji Kajihara and
                  Yoshiyuki Nakamura},
  title        = {Good Die Prediction Modelling from Limited Test Items},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2018, Harbin,
                  China, August 15-17, 2018},
  pages        = {115--120},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ITC-Asia.2018.00030},
  doi          = {10.1109/ITC-ASIA.2018.00030},
  timestamp    = {Mon, 09 Aug 2021 14:54:04 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/NishimiSKN18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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