BibTeX record conf/itc-asia/MiyakeKK20

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@inproceedings{DBLP:conf/itc-asia/MiyakeKK20,
  author       = {Yousuke Miyake and
                  Takaaki Kato and
                  Seiji Kajihara},
  title        = {Path Delay Measurement with Correction for Temperature And Voltage
                  Variations},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2020, Taipei,
                  Taiwan, September 23-25, 2020},
  pages        = {112--117},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC-Asia51099.2020.00031},
  doi          = {10.1109/ITC-ASIA51099.2020.00031},
  timestamp    = {Fri, 09 Apr 2021 18:51:01 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/MiyakeKK20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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