BibTeX record conf/itc-asia/LuWHM22

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@inproceedings{DBLP:conf/itc-asia/LuWHM22,
  author       = {Shyue{-}Kung Lu and
                  Yu{-}Sheng Wu and
                  Jin{-}Hua Hong and
                  Kohei Miyase},
  title        = {Fault Resilience Techniques for Flash Memory of {DNN} Accelerators},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00011},
  doi          = {10.1109/ITCASIA55616.2022.00011},
  timestamp    = {Mon, 21 Nov 2022 17:42:16 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LuWHM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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