BibTeX record conf/itc-asia/LiC20

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@inproceedings{DBLP:conf/itc-asia/LiC20,
  author       = {Chia{-}Chuan Li and
                  Soon{-}Jyh Chang},
  title        = {Modified {BER} Test for {SAR} ADCs},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2020, Taipei,
                  Taiwan, September 23-25, 2020},
  pages        = {100--105},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC-Asia51099.2020.00029},
  doi          = {10.1109/ITC-ASIA51099.2020.00029},
  timestamp    = {Thu, 22 Oct 2020 12:44:28 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LiC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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