BibTeX record conf/itc-asia/KangLL22

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@inproceedings{DBLP:conf/itc-asia/KangLL22,
  author       = {Duo{-}Yao Kang and
                  Shiou{-}Ning Lin and
                  Kuen{-}Jong Lee},
  title        = {Diagnosing Transition Delay Faults under Scan-Based Logic Array},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {13--18},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00013},
  doi          = {10.1109/ITCASIA55616.2022.00013},
  timestamp    = {Mon, 21 Nov 2022 17:42:16 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/KangLL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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