BibTeX record conf/itc-asia/HuCWWHTCCC20

• > Home > conf/itc-asia/HuCWWHTCCC20

@inproceedings{DBLP:conf/itc-asia/HuCWWHTCCC20,
  author       = {Yu{-}Pang Hu and
                  Shuo{-}Wen Chang and
                  Kai{-}Chiang Wu and
                  Chi Chun Wang and
                  Fu{-}Sheng Huang and
                  Yi{-}Lun Tang and
                  Yung{-}Chen Chen and
                  Ming{-}Chien Chen and
                  Mango C.{-}T. Chao},
  title        = {Test Methodology for Defect-based Bridge Faults},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2020, Taipei,
                  Taiwan, September 23-25, 2020},
  pages        = {106--111},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/ITC-Asia51099.2020.00030},
  doi          = {10.1109/ITC-ASIA51099.2020.00030},
  timestamp    = {Thu, 22 Oct 2020 12:44:28 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/HuCWWHTCCC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}