BibTeX record conf/itc-asia/GuoACC18

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@inproceedings{DBLP:conf/itc-asia/GuoACC18,
  author       = {Ruifeng Guo and
                  Brian Archer and
                  Kevin Chau and
                  Xiaolei Cai},
  title        = {Efficient Cell-Aware Defect Characterization for Multi-bit Cells},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2018, Harbin,
                  China, August 15-17, 2018},
  pages        = {7--12},
  publisher    = {{IEEE}},
  year         = {2018},
  url          = {https://doi.org/10.1109/ITC-Asia.2018.00012},
  doi          = {10.1109/ITC-ASIA.2018.00012},
  timestamp    = {Sun, 04 Aug 2024 19:44:11 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/GuoACC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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