BibTeX record conf/itc-asia/BrackmannJBMWWM22

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@inproceedings{DBLP:conf/itc-asia/BrackmannJBMWWM22,
  author       = {Leon Brackmann and
                  Atousa Jafari and
                  Christopher Bengel and
                  Mahta Mayahinia and
                  Rainer Waser and
                  Dirk J. Wouters and
                  Stephan Menzel and
                  Mehdi B. Tahoori},
  title        = {A failure analysis framework of ReRAM In-Memory Logic operations},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2022, Taipei,
                  Taiwan, August 24-26, 2022},
  pages        = {67--72},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ITCAsia55616.2022.00022},
  doi          = {10.1109/ITCASIA55616.2022.00022},
  timestamp    = {Sat, 30 Sep 2023 09:50:57 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/BrackmannJBMWWM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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