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BibTeX record conf/itc-asia/AppelloLP17
@inproceedings{DBLP:conf/itc-asia/AppelloLP17, author = {Davide Appello and M. Laurino and Marco Pranzo}, title = {A mathematical model to assess the influence of parallelism in a semiconductor back-end test floor}, booktitle = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan, September 13-15, 2017}, pages = {138--143}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/ITC-ASIA.2017.8097129}, doi = {10.1109/ITC-ASIA.2017.8097129}, timestamp = {Thu, 16 Mar 2023 20:00:43 +0100}, biburl = {https://dblp.org/rec/conf/itc-asia/AppelloLP17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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