BibTeX record conf/itc-asia/AppelloLP17

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@inproceedings{DBLP:conf/itc-asia/AppelloLP17,
  author       = {Davide Appello and
                  M. Laurino and
                  Marco Pranzo},
  title        = {A mathematical model to assess the influence of parallelism in a semiconductor
                  back-end test floor},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {138--143},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097129},
  doi          = {10.1109/ITC-ASIA.2017.8097129},
  timestamp    = {Thu, 16 Mar 2023 20:00:43 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/AppelloLP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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