BibTeX record conf/itc-asia/0005CGC21

download as .bib file

@inproceedings{DBLP:conf/itc-asia/0005CGC21,
  author       = {Yu Huang and
                  Wu{-}Tung Cheng and
                  Ruifeng Guo and
                  Sameer Chillarige},
  title        = {Diagnosis and Yield Learning},
  booktitle    = {{IEEE} International Test Conference in Asia, ITC-Asia 2021, Shanghai,
                  China, August 18-20, 2021},
  pages        = {1},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ITC-Asia53059.2021.9808597},
  doi          = {10.1109/ITC-ASIA53059.2021.9808597},
  timestamp    = {Fri, 15 Jul 2022 10:59:39 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/0005CGC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.