Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects.

Michael Yap San Min Philippe Maurine Magali Bastian Michel Robert Statistical Sizing of an eSRAM Dummy Bitline Driver for Read Margin Improvement in the Presence of Variability Aspects. 310-315 2008 ISVLSI http://dx.doi.org/10.1109/ISVLSI.2008.57 conf/isvlsi/2008 db/conf/isvlsi/isvlsi2008.html#MinMBR08