Teng Lin Jianhua Feng Yangyuan Wang A New Test Data Compression Scheme for Multi-scan Designs. 179-185 2007 conf/isvlsi/2007 ISVLSI http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2007.10 db/conf/isvlsi/isvlsi2007.html#LinFW07