Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis.

Prashant Dubey Akhil Garg Sravan Kumar Bhaskarani Low Area Adaptive Fail-Data Compression Methodology for Defect Classification and Production Phase Prognosis. 171-178 2007 conf/isvlsi/2007 ISVLSI http://doi.ieeecomputersociety.org/10.1109/ISVLSI.2007.63 db/conf/isvlsi/isvlsi2007.html#DubeyGB07