@inproceedings{DBLP:conf/issta/TurhanBM08,
author = {Burak Turhan and
Ayse Basar Bener and
Tim Menzies},
title = {Nearest neighbor sampling for cross company defect predictors:
abstract only},
booktitle = {DEFECTS},
year = {2008},
pages = {26},
ee = {http://doi.acm.org/10.1145/1390817.1390824},
crossref = {DBLP:conf/issta/2008d},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/issta/2008d,
editor = {Premkumar T. Devanbu and
Brendan Murphy and
Nachiappan Nagappan and
Thomas Zimmermann},
title = {Proceedings of the 2008 Workshop on Defects in Large Software
Systems, held in conjunction with the ACM SIGSOFT International
Symposium on Software Testing and Analysis (ISSTA 2008),
DEFECTS 2008, Seattle, Washington, USA, July 20, 2008},
booktitle = {DEFECTS},
publisher = {ACM},
year = {2008},
isbn = {978-1-60558-051-7},
bibsource = {DBLP, http://dblp.uni-trier.de}
}