BibTeX record conf/issre/AgarwalCP23

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@inproceedings{DBLP:conf/issre/AgarwalCP23,
  author       = {Udit Kumar Agarwal and
                  Abraham Chan and
                  Karthik Pattabiraman},
  title        = {Resilience Assessment of Large Language Models under Transient Hardware
                  Faults},
  booktitle    = {34th {IEEE} International Symposium on Software Reliability Engineering,
                  {ISSRE} 2023, Florence, Italy, October 9-12, 2023},
  pages        = {659--670},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/ISSRE59848.2023.00052},
  doi          = {10.1109/ISSRE59848.2023.00052},
  timestamp    = {Tue, 14 Nov 2023 16:09:47 +0100},
  biburl       = {https://dblp.org/rec/conf/issre/AgarwalCP23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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